Fundamentals of Electromigration-Aware Integrated Circuit Design
暫譯: 電遷移意識的集成電路設計基礎

Lienig, Jens, Rothe, Susann, Thiele, Matthias

Fundamentals of Electromigration-Aware Integrated Circuit Design
  • 出版商: Springer
  • 出版日期: 2025-02-26
  • 售價: $5,230
  • 貴賓價: 9.5 折 $4,969
  • 語言: 英文
  • 頁數: 167
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 3031800222
  • ISBN-13: 9783031800221

    • 海外代購書籍(需單獨結帳)

相關主題

商品描述

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

商品描述(中文翻譯)

本書提供了電遷移及其對電子電路可靠性影響的全面概述。這第二版已更新，以介紹對電遷移物理過程理解的最新進展，讓讀者具備採取適當對策的知識。書中提出了一整套選項，以修改目前的集成電路（IC）設計方法，來防止電遷移。最後，作者展示了如何在當前和未來的技術中利用特定效應，以減少電遷移對電路可靠性的負面影響。

作者簡介

Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch GmbH.

Susann Rothe is a scientific assistant at Dresden University of Technology, Germany. She is working towards her Ph.D. in the field of migration modeling and verification with physics-based models. Her research interests include technology characterization and temperature effects for interconnect reliability.

Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration avoidance in physical design. Currently he works on the reliability of electronic, mechatronic and photonic systems.

作者簡介(中文翻譯)

耶恩斯·利尼格是德國德累斯頓工業大學電機與電子設計研究所的所長。他在多晶片模組的計算機輔助物理設計領域獲得博士學位，並曾在維吉尼亞大學（University of Virginia）和蒙特利爾的康考迪亞大學（Concordia University）擔任研究員。之後，他在Tanner Research, Inc.和羅伯特·博世有限公司（Robert Bosch GmbH）擔任專案經理。

蘇珊·羅特是德國德累斯頓工業大學的科學助理。她正在進行基於物理模型的遷移建模和驗證的博士研究。她的研究興趣包括技術特性化和互連可靠性的溫度效應。

馬提亞斯·蒂勒是德國德累斯頓工業大學的科學助理。他在物理設計中的電遷移避免領域獲得博士學位。目前，他專注於電子、機電和光子系統的可靠性研究。

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