Scanning Probe Microscopy: The Lab on a Tip
暫譯: 掃描探針顯微術：尖端實驗室

Meyer, Ernst, Bennewitz, Roland, Hug, Hans J.

Scanning Probe Microscopy: The Lab on a Tip

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商品描述

Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor- age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi- ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques- tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen- eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora- tory.

商品描述(中文翻譯)

自從二十年前發明以來，掃描探針顯微鏡已成為各種實驗室中廣泛使用的方法，這些實驗室的範疇包括工業磁性儲存開發和結構生物學。因此，使用者社群涵蓋了生物學家、醫學研究人員、物理學家和工程師，所有人都在利用其無與倫比的解析度，並從相對簡單的實驗實施中獲益。近年來，作者們教授了多門關於掃描探針顯微鏡的課程，通常結合實作學生實驗。聽眾的範圍從物理學新生到生物學博士後研究人員，甚至還包括高中教師。我們認為，除了涵蓋掃描探針顯微鏡背後的物理原理外，還特別重要的是探討儀器設計、不同成像模式的基本特徵以及重複出現的伪影。藉由這本書，我們的目的是提供一本針對所有類型課程的通用教科書，這些課程涉及掃描探針顯微鏡。三年級以上的本科生應能夠將其用作自學或作為掃描探針顯微鏡課程的教科書。此外，它也將在任何掃描探針顯微鏡實驗室中作為參考書籍具有價值。

作者簡介

Ernst Meyer is Professor of Physics at the University of Basel and an expert in the field of atomic force microscopy. He has chaired European programmes for the study of nanotribology and is member of the executive board of the Swiss Nanoscience Institute. His research focuses on scientific questions in the fields of nanomechanics and nanoelectronics.

Roland Bennewitz is Professor of Physics at Saarland University and group leader at the Leibniz Institute for New Materials (INM) in Saarbrücken, Germany. His main areas of expertise are high-resolution friction force microscopy, force microscopy of liquid-solid interfaces, and control of adhesion and friction by macromolecular functionalization or ionic liquids. He has chaired international conferences such are the Gordon Research Conference in Tribology 2014 and a Beilstein Symposium on Molecular Mechanisms in Tribology in 2016. He currently serves as on the Editorial Board of the Journal Tribology Letters.

Hans Josef Hug is Professor of Physics at the University of Basel and laboratory head at the Empa - Swiss Federal Laboratories for Materials Testing and Research in Dübendorf, near Zürich, where he leads the laboratory for Magnetic and Functional Thin Films. In 2003 he and his team received the Swiss Technology Award for the development of high resolution and quantitative magnetic force microscopy. His main areas of expertise are magnetism and magnetic thin film systems and scanning force microscopy with a particular emphasis on magnetic force microscopy.

作者簡介(中文翻譯)

恩斯特·邁耶是巴塞爾大學的物理學教授，專精於原子力顯微鏡領域。他曾主持歐洲的納米摩擦學研究計畫，並且是瑞士納米科學研究所執行委員會的成員。他的研究重點在於納米力學和納米電子學領域的科學問題。

羅蘭·本內維茨是薩爾蘭大學的物理學教授，並且是德國薩爾布呂肯的萊布尼茨新材料研究所（INM）的研究小組負責人。他的主要專業領域包括高解析度摩擦力顯微鏡、液固界面的力顯微鏡，以及通過大分子功能化或離子液體來控制黏附和摩擦。他曾主持國際會議，如2014年的戈登摩擦學研究會議和2016年的貝爾斯坦分會議，主題為摩擦學中的分子機制。他目前擔任《摩擦學快報》（Tribology Letters）期刊的編輯委員會成員。

漢斯·約瑟夫·胡格是巴塞爾大學的物理學教授，並且是位於蘇黎世附近杜本多夫的瑞士聯邦材料測試與研究實驗室（Empa）的實驗室負責人，他領導著磁性和功能性薄膜實驗室。2003年，他和他的團隊因開發高解析度和定量的磁力顯微鏡而獲得瑞士科技獎。他的主要專業領域包括磁性和磁性薄膜系統，以及特別強調磁力顯微鏡的掃描力顯微鏡。

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