Passive RF Integrated Circuits: Modeling, Characterization and Measurement (Hardcover)
暫譯: 被動射頻集成電路:建模、特性化與測量(精裝版)
Pierre Saguet
- 出版商: Wiley
- 出版日期: 2009-12-01
- 定價: $3,600
- 售價: 9.5 折 $3,420
- 語言: 英文
- 頁數: 288
- 裝訂: Hardcover
- ISBN: 1848211759
- ISBN-13: 9781848211759
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相關分類:
RFID、電子學 Eletronics、電磁學 Electromagnetics
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相關主題
商品描述
This book, written by recognized experts in the field, is intended for designers of RF or microwave passive integrated circuits. It describes methods used for modeling passive circuits using the most common numerical analysis techniques (the method of moments, finite element methods, FDTD, TLM), and pays particular attention to propagation phenomena. Interconnections and packaging modeling are included, as well as an original method for multi-scale circuit modeling.
Characterization and measurement methods in the time and frequency domains are the subject of two very detailed chapters. Measurement errors using Vector Network Analyzer (VNA ) and appropriate corrections are detailed and the divergences between all the various parameters S, Z, Y, h, T, ABCD are given. Time domain reflectometry and its use are also covered in detail.
商品描述(中文翻譯)
本書由該領域的知名專家撰寫,旨在為射頻(RF)或微波被動積體電路的設計師提供指導。書中描述了使用最常見的數值分析技術(如矩量法、有限元素法、時域有限差分法(FDTD)、傳輸線矩量法(TLM))來建模被動電路的方法,並特別關注傳播現象。書中還包括互連和封裝建模,以及一種原創的多尺度電路建模方法。
時間域和頻率域的特性化和測量方法是兩個非常詳細的章節的主題。使用矢量網路分析儀(VNA)進行測量的誤差及其適當的修正也有詳細說明,並提供了各種參數 S、Z、Y、h、T、ABCD 之間的差異。時間域反射測量技術及其應用也有詳細的介紹。