Advanced Techniques for Maintenance Modeling and Reliability Analysis of Repairable Systems

Sharma, Garima, Rai, Rajiv Nandan

  • 出版商: Wiley-Scrivener
  • 出版日期: 2023-10-31
  • 售價: $5,820
  • 貴賓價: 9.5$5,529
  • 語言: 英文
  • 頁數: 224
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 1394174438
  • ISBN-13: 9781394174430
  • 相關分類: 工程數學 Engineering-mathematics
  • 海外代購書籍(需單獨結帳)

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商品描述

The content presented in this book is highly inspired by the existing limitations of GRP model and the problems confronted by the MRO facilities in the industries dealing with large and complex repairable systems. Through this book, the authors have attempted to equip the MRO facilities with more advanced and scientific tools and techniques by addressing various limitations related to the reliability analysis of repairable systems. This book is dedicated to various imperfect maintenance-based virtual age models and methodologies to bridge various research gaps present in the available literature. A summary of deliverables from this book are as follows:

  • This book presents the basic concepts of maintenance and provide a virtual age model which can accommodate all maintenance activities i.e., CM, SPM and overhaul as imperfect at the same time.
  • The book provides the basic concepts of censoring in repairable systems along with the concept of black box and failure modes approach in the censoring. To deal with FM wise censored data analysis of repairable systems, we present basic terminologies to represent different cases of single and multiply censoring failure mode (FM) approaches. We also highlighted that how the proposed work could be useful for the industries in conducting failure modes and effect analysis (FMEA) and estimating mean residual life (MRL) of repairable systems.
  • We also present methodology that applies risk-based threshold on intensity function and provides a threshold to declare the system/component as high failure rate components (HFRCs). This threshold provides an upper bound for shortlisting of components failing frequently, increases availability, and reduces the risk and cost involved in operations.
  • Identifying a system as HFRCs in an important task, but for an industry dealing with critical systems, preventing the system from being HFRC is more important, since risk involved in such systems would be very high. Thus, this book presents a progressive maintenance policy (PMP) for repairable systems according to which system's hard life, SPM time and overhaul period should be revised after each SPM activity according to its failure profile and MRL in such a way that the risk of failure is not increased.
  • This book also focusses on qualitative analysis of repair quality. Assuming repair quality as a subjective variable, we present various factors that affect the repair quality most and modelled their interdependency using Bayesian networks (BN).

作者簡介

Garima Sharma, PhD, completed her doctorate at Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology Kharagpur, West Bengal, India. Her research interests include aerospace reliability and maintenance engineering, reliability, and risk analysis of reentry space vehicles. She has authored 10+ journal publications (SCI and Scopus indexed) including three international conferences and two book chapters.

Rajiv Nandan Rai, PhD, is an accomplished engineer with over 28 years of experience in the field of reliability, quality, and maintenance engineering with an industrial experience of 23 years in the Indian Air Force, in which he has worked at all levels of maintenance, repair, and overhaul of aircraft, aero engines, and their components. He is currently an assistant professor at Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology Kharagpur. He has authored 30 publications (SCI and Scopus indexed) including one book and four book chapters. His research interests include reliability analysis of repairable systems, maintenance engineering, quality management and engineering, machine diagnostics, and prognostics.