Handbook of Microwave Component Measurements: with Advanced VNA Techniques, 2/e (Hardcover)
Joel P. Dunsmore
- 出版商: Wiley
- 出版日期: 2012-11-20
- 售價: $4,900
- 貴賓價: 9.5 折 $4,655
- 語言: 英文
- 頁數: 636
- 裝訂: Hardcover
- ISBN: 1119979552
- ISBN-13: 9781119979555
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相關分類:
微波工程 Microwave
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其他版本:
Handbook of Microwave Component Measurements: with Advanced VNA Techniques, 2/e (Hardcover)
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相關主題
商品描述
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers.
The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory.
Key Features:
- Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
- Offers a detailed explanation of algorithms and mathematics behind measurements and error correction
- Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader
- Written by the principle developer and designer of many of the measurement methods described
This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
商品描述(中文翻譯)
本書提供了關於射頻(RF)和微波元件(無論是主動還是被動)測量的最先進的內容。對於研發和測試工程師來說,這是一本完美的參考書,涵蓋了從基本測量的最佳實踐到錯誤分析、修正方法和不確定性分析的深入探討,提供了理解微波測量所需的一切。主要集中於使用向量網路分析儀進行的主動和被動測量,這些技術和分析同樣適用於使用頻譜分析儀或噪聲指標分析儀進行的測量。
早期章節提供了測量的理論基礎,並附有廣泛的元件特性和測量參數的定義與描述。後面的章節則針對電纜、連接器和濾波器測量、低噪聲、高增益和高功率放大器測量、各種混頻器和頻率轉換器測量,以及對夾具、去嵌入、平衡測量和校準技術的全面檢查,提供了詳細的範例。關於時域理論和測量的章節是目前為止對該主題最完整的處理,詳細介紹了基礎數學和有關時域門控的新材料。作為許多所介紹方法的發明者,並在最現代的測量平台上擔任開發工程師已有30年,作者提供了對現代測量理論的獨特見解。
主要特色:
- 解釋被測設備(DUT)與測量設備之間的互動,展示確定DUT真實特性和優化設置及測量時間的最佳實踐
- 提供測量和錯誤修正背後的算法和數學的詳細解釋
- 提供大量插圖(例如電路連接和測量設置的方塊圖)和針對實際設備的實用範例,能立即為讀者帶來好處
- 由許多所描述測量方法的主要開發者和設計者撰寫
本書將成為射頻和微波研發及測試工程師、衛星測試工程師、雷達工程師、功率放大器設計師、低噪聲放大器設計師和混頻器設計師的寶貴指南。大學研究人員和微波設計及測試的研究生也會對本書感興趣。